Transmission Electron Microscopy:Article Title: MAM volume 24 issue s1 Cover and Front matter
Article Snippet: ; J Michael, J Carroll 612 Complementarity of On-axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM; E Brodu, E Bouzy 614 Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr; RE White, ML Weaver 616 Non-local Denoising of EBSD Patterns for Enhanced Indexing; DJ Rowenhorst, P Brewick 618 Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development; T-T Chou, R-W Song, J-G Duh 620 The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias; BJ Griffin, AA Suvorova, DC Joy, JR Michael 622 Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope; M Bertilson, DJ Stowe, T Worsely, T Franklin, L Muray, M Hsueh, JA Hunt 624 Joy of Scanning with Electron and X-ray Imaging; PT Pinard, S Burgess, A Hyde, J Holland, P Statham 626 DELTA – A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging; RR Schroeder, B Schindler, M Schnell, C Hendrich, J Wensorra, W-S Zhang, J Eisele, L Veith 628 Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends; J Kammerer, R Alkarsifi, C Videlot-Ackermann, O Margeat, B Schindler, I Wacker, J Ackermann, RR Schröder 630 A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids; YN Picard 632 Grain Size Analysis in Lithium Aluminate Ceramics; BR Johnson, N Canfield, JV Crum, B McCarthy https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxv 634 Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns; BD Myers, KA Hujsak, VP Dravid 636 In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System; J-G Zheng 638 Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope; I Müllerová, L Frank, I Konvalina, E Mikmeková 640 The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers, N Brodusch, R Gauvin, ML Trudeau, K Zaghib 642 Low Energy Secondary Electron Imaging of Nanosheets Using Inverted Fountain Detector; T Sekiguchi, T Agemura, Y Yao 644 RISE Microscopy: The Benefits of Correlative Microscopy for High Resolution Structural and Chemical Imaging of Biominerals; U Schmidt, M Eder, W Liu, D Steinmetz, G Wille 646 Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM; T Nomaguchi, S Motomura, K Nishinaka, T Agemura, T Kawasaki, R Yoshida, T Kato 648 Creating Ultrafast Electron Pulses using a Microfabricated Laser-triggered Beam Blanker; GI Weppelman, R van Tol, CC Heerkens, R Moerland, JJ Hoogenboom, P Kruit 650 New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors; M Schmid, A Liebel, G Moldovan, R Lackner, D Steigenhoefer, A Niculae, H Soltau 652 SEM Technique-based Automatic Analysis for Metal Powders and Defects in Additive Manufactured Components; Y Sun, M Aindow, R Hebert 654 Live Quantitative BSE Acquisition with Standard-less Calibration; M Hemmleb, M Schmid, U Grauel, W Joachimi, G Moldovan 656 X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM; JT Sagar, D Wood, P Pinard, JY Howe, J Holland, SR Burgess, PJ Stathem 658 Developing a Programmable STEM Detector for the Scanning Electron Microscope; BW Caplins, JD Holm, RR Keller 660 Environmental SEM as a Surface-Sensitive Tool to Study Reaction Dynamics; C Barroo, Z-J Wang, MG Willinger 662 Voltage Contrast Imaging with Energy-Controlled Signal in an FE-SEM; Y Hashimoto, S Takeuchi, T Sunaoshi, Y Yamazawa 664 The Powder-Pack Boriding and Nitriding Process: Microstructural Characterization of Boride and Nitride Layers on ARMCO Pure Iron; MO Domínguez, IS Marmolejo, ME Espinosa, MÁF Rentería, LEM Martínez, AA Flores 666 Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625; EM Getto, B Tobie, E Bautista, A Bullens, D Gandy, JP Wharry https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxix 774 New Approaches to Determine K Line Ratios of Pure Elements; R Terborg, F Reinhardt, F Nitsche, T Wolff 776 Soft Matter X-Ray Microanalysis in the Analytical Electron Microscope; M Ovsyanko, E Yucelen, E Pechnikova, M Meiken Falke, Q Chen, NJ Zaluzec 778 Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan, H Demers, R Gauvin 780 Quantitative Compositional Stage Mapping and Cluster Analysis; PK Carpenter 782 Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach; SM Seddio, PK Carpenter 784 A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis; JM Davis, J Schmidt, M Huth, R Hartmann, H Soltau, L Strüder 786 EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector; JJ McCarthy, JF Konopka 788 Quantitative Elemental Mapping of Alkali Activated Slag Cement; NA Alharbi, RK Hailstone, B Varela 790 Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78; J Twilley 792 Combined Energy Dispersive Spectrometry/Wavelength Dispersive Spectrometry Analysis of Geological Materials using an Electron Probe Microanalyzer; E Bullock 794 The Performance of Energy-dispersive X-ray Analysis at High Temperatures Using a Windowless Multidetector XEDS System; C Mitterbauer, M Ovsyanko, Y Rikers, B Freitag 796 Silicon Drift Detectors in Electron Microscopy – An Over 20-year History with a Bright Future; A Liebel, A Schöning, A Bechteler, K Hermenau, K Heinzinger, L Strüder, A Niculae, H Soltau 798 Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors; R Terborg, M Falke, T Mohr-Westheide, T Salge 800 Structural Characterization of Cu10Mo alloy Synthesized by Mechanical Alloying; O Hernández, L Béjar, A Medina, SE Borjas
Microscopy:Article Title: MAM volume 24 issue s1 Cover and Front matter
Article Snippet: ; J Michael, J Carroll 612 Complementarity of On-axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM; E Brodu, E Bouzy 614 Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr; RE White, ML Weaver 616 Non-local Denoising of EBSD Patterns for Enhanced Indexing; DJ Rowenhorst, P Brewick 618 Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development; T-T Chou, R-W Song, J-G Duh 620 The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias; BJ Griffin, AA Suvorova, DC Joy, JR Michael 622 Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope; M Bertilson, DJ Stowe, T Worsely, T Franklin, L Muray, M Hsueh, JA Hunt 624 Joy of Scanning with Electron and X-ray Imaging; PT Pinard, S Burgess, A Hyde, J Holland, P Statham 626 DELTA – A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging; RR Schroeder, B Schindler, M Schnell, C Hendrich, J Wensorra, W-S Zhang, J Eisele, L Veith 628 Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends; J Kammerer, R Alkarsifi, C Videlot-Ackermann, O Margeat, B Schindler, I Wacker, J Ackermann, RR Schröder 630 A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids; YN Picard 632 Grain Size Analysis in Lithium Aluminate Ceramics; BR Johnson, N Canfield, JV Crum, B McCarthy https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxv 634 Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns; BD Myers, KA Hujsak, VP Dravid 636 In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System; J-G Zheng 638 Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope; I Müllerová, L Frank, I Konvalina, E Mikmeková 640 The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers, N Brodusch, R Gauvin, ML Trudeau, K Zaghib 642 Low Energy Secondary Electron Imaging of Nanosheets Using Inverted Fountain Detector; T Sekiguchi, T Agemura, Y Yao 644 RISE Microscopy: The Benefits of Correlative Microscopy for High Resolution Structural and Chemical Imaging of Biominerals; U Schmidt, M Eder, W Liu, D Steinmetz, G Wille 646 Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM; T Nomaguchi, S Motomura, K Nishinaka, T Agemura, T Kawasaki, R Yoshida, T Kato 648 Creating Ultrafast Electron Pulses using a Microfabricated Laser-triggered Beam Blanker; GI Weppelman, R van Tol, CC Heerkens, R Moerland, JJ Hoogenboom, P Kruit 650 New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors; M Schmid, A Liebel, G Moldovan, R Lackner, D Steigenhoefer, A Niculae, H Soltau 652 SEM Technique-based Automatic Analysis for Metal Powders and Defects in Additive Manufactured Components; Y Sun, M Aindow, R Hebert 654 Live Quantitative BSE Acquisition with Standard-less Calibration; M Hemmleb, M Schmid, U Grauel, W Joachimi, G Moldovan 656 X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM; JT Sagar, D Wood, P Pinard, JY Howe, J Holland, SR Burgess, PJ Stathem 658 Developing a Programmable STEM Detector for the Scanning Electron Microscope; BW Caplins, JD Holm, RR Keller 660 Environmental SEM as a Surface-Sensitive Tool to Study Reaction Dynamics; C Barroo, Z-J Wang, MG Willinger 662 Voltage Contrast Imaging with Energy-Controlled Signal in an FE-SEM; Y Hashimoto, S Takeuchi, T Sunaoshi, Y Yamazawa 664 The Powder-Pack Boriding and Nitriding Process: Microstructural Characterization of Boride and Nitride Layers on ARMCO Pure Iron; MO Domínguez, IS Marmolejo, ME Espinosa, MÁF Rentería, LEM Martínez, AA Flores 666 Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625; EM Getto, B Tobie, E Bautista, A Bullens, D Gandy, JP Wharry https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxix 774 New Approaches to Determine K Line Ratios of Pure Elements; R Terborg, F Reinhardt, F Nitsche, T Wolff 776 Soft Matter X-Ray Microanalysis in the Analytical Electron Microscope; M Ovsyanko, E Yucelen, E Pechnikova, M Meiken Falke, Q Chen, NJ Zaluzec 778 Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan, H Demers, R Gauvin 780 Quantitative Compositional Stage Mapping and Cluster Analysis; PK Carpenter 782 Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach; SM Seddio, PK Carpenter 784 A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis; JM Davis, J Schmidt, M Huth, R Hartmann, H Soltau, L Strüder 786 EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector; JJ McCarthy, JF Konopka 788 Quantitative Elemental Mapping of Alkali Activated Slag Cement; NA Alharbi, RK Hailstone, B Varela 790 Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78; J Twilley 792 Combined Energy Dispersive Spectrometry/Wavelength Dispersive Spectrometry Analysis of Geological Materials using an Electron Probe Microanalyzer; E Bullock 794 The Performance of Energy-dispersive X-ray Analysis at High Temperatures Using a Windowless Multidetector XEDS System; C Mitterbauer, M Ovsyanko, Y Rikers, B Freitag 796 Silicon Drift Detectors in Electron Microscopy – An Over 20-year History with a Bright Future; A Liebel, A Schöning, A Bechteler, K Hermenau, K Heinzinger, L Strüder, A Niculae, H Soltau 798 Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors; R Terborg, M Falke, T Mohr-Westheide, T Salge 800 Structural Characterization of Cu10Mo alloy Synthesized by Mechanical Alloying; O Hernández, L Béjar, A Medina, SE Borjas
Imaging:Article Title: MAM volume 24 issue s1 Cover and Front matter
Article Snippet: ; J Michael, J Carroll 612 Complementarity of On-axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM; E Brodu, E Bouzy 614 Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr; RE White, ML Weaver 616 Non-local Denoising of EBSD Patterns for Enhanced Indexing; DJ Rowenhorst, P Brewick 618 Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development; T-T Chou, R-W Song, J-G Duh 620 The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias; BJ Griffin, AA Suvorova, DC Joy, JR Michael 622 Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope; M Bertilson, DJ Stowe, T Worsely, T Franklin, L Muray, M Hsueh, JA Hunt 624 Joy of Scanning with Electron and X-ray Imaging; PT Pinard, S Burgess, A Hyde, J Holland, P Statham 626 DELTA – A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging; RR Schroeder, B Schindler, M Schnell, C Hendrich, J Wensorra, W-S Zhang, J Eisele, L Veith 628 Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends; J Kammerer, R Alkarsifi, C Videlot-Ackermann, O Margeat, B Schindler, I Wacker, J Ackermann, RR Schröder 630 A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids; YN Picard 632 Grain Size Analysis in Lithium Aluminate Ceramics; BR Johnson, N Canfield, JV Crum, B McCarthy https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxv 634 Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns; BD Myers, KA Hujsak, VP Dravid 636 In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System; J-G Zheng 638 Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope; I Müllerová, L Frank, I Konvalina, E Mikmeková 640 The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers, N Brodusch, R Gauvin, ML Trudeau, K Zaghib 642 Low Energy Secondary Electron Imaging of Nanosheets Using Inverted Fountain Detector; T Sekiguchi, T Agemura, Y Yao 644 RISE Microscopy: The Benefits of Correlative Microscopy for High Resolution Structural and Chemical Imaging of Biominerals; U Schmidt, M Eder, W Liu, D Steinmetz, G Wille 646 Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM; T Nomaguchi, S Motomura, K Nishinaka, T Agemura, T Kawasaki, R Yoshida, T Kato 648 Creating Ultrafast Electron Pulses using a Microfabricated Laser-triggered Beam Blanker; GI Weppelman, R van Tol, CC Heerkens, R Moerland, JJ Hoogenboom, P Kruit 650 New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors; M Schmid, A Liebel, G Moldovan, R Lackner, D Steigenhoefer, A Niculae, H Soltau 652 SEM Technique-based Automatic Analysis for Metal Powders and Defects in Additive Manufactured Components; Y Sun, M Aindow, R Hebert 654 Live Quantitative BSE Acquisition with Standard-less Calibration; M Hemmleb, M Schmid, U Grauel, W Joachimi, G Moldovan 656 X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM; JT Sagar, D Wood, P Pinard, JY Howe, J Holland, SR Burgess, PJ Stathem 658 Developing a Programmable STEM Detector for the Scanning Electron Microscope; BW Caplins, JD Holm, RR Keller 660 Environmental SEM as a Surface-Sensitive Tool to Study Reaction Dynamics; C Barroo, Z-J Wang, MG Willinger 662 Voltage Contrast Imaging with Energy-Controlled Signal in an FE-SEM; Y Hashimoto, S Takeuchi, T Sunaoshi, Y Yamazawa 664 The Powder-Pack Boriding and Nitriding Process: Microstructural Characterization of Boride and Nitride Layers on ARMCO Pure Iron; MO Domínguez, IS Marmolejo, ME Espinosa, MÁF Rentería, LEM Martínez, AA Flores 666 Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625; EM Getto, B Tobie, E Bautista, A Bullens, D Gandy, JP Wharry https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxix 774 New Approaches to Determine K Line Ratios of Pure Elements; R Terborg, F Reinhardt, F Nitsche, T Wolff 776 Soft Matter X-Ray Microanalysis in the Analytical Electron Microscope; M Ovsyanko, E Yucelen, E Pechnikova, M Meiken Falke, Q Chen, NJ Zaluzec 778 Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan, H Demers, R Gauvin 780 Quantitative Compositional Stage Mapping and Cluster Analysis; PK Carpenter 782 Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach; SM Seddio, PK Carpenter 784 A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis; JM Davis, J Schmidt, M Huth, R Hartmann, H Soltau, L Strüder 786 EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector; JJ McCarthy, JF Konopka 788 Quantitative Elemental Mapping of Alkali Activated Slag Cement; NA Alharbi, RK Hailstone, B Varela 790 Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78; J Twilley 792 Combined Energy Dispersive Spectrometry/Wavelength Dispersive Spectrometry Analysis of Geological Materials using an Electron Probe Microanalyzer; E Bullock 794 The Performance of Energy-dispersive X-ray Analysis at High Temperatures Using a Windowless Multidetector XEDS System; C Mitterbauer, M Ovsyanko, Y Rikers, B Freitag 796 Silicon Drift Detectors in Electron Microscopy – An Over 20-year History with a Bright Future; A Liebel, A Schöning, A Bechteler, K Hermenau, K Heinzinger, L Strüder, A Niculae, H Soltau 798 Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors; R Terborg, M Falke, T Mohr-Westheide, T Salge 800 Structural Characterization of Cu10Mo alloy Synthesized by Mechanical Alloying; O Hernández, L Béjar, A Medina, SE Borjas
Spectroscopy:Article Title: MAM volume 24 issue s1 Cover and Front matter
Article Snippet: ; J Michael, J Carroll 612 Complementarity of On-axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM; E Brodu, E Bouzy 614 Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr; RE White, ML Weaver 616 Non-local Denoising of EBSD Patterns for Enhanced Indexing; DJ Rowenhorst, P Brewick 618 Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development; T-T Chou, R-W Song, J-G Duh 620 The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias; BJ Griffin, AA Suvorova, DC Joy, JR Michael 622 Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope; M Bertilson, DJ Stowe, T Worsely, T Franklin, L Muray, M Hsueh, JA Hunt 624 Joy of Scanning with Electron and X-ray Imaging; PT Pinard, S Burgess, A Hyde, J Holland, P Statham 626 DELTA – A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging; RR Schroeder, B Schindler, M Schnell, C Hendrich, J Wensorra, W-S Zhang, J Eisele, L Veith 628 Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends; J Kammerer, R Alkarsifi, C Videlot-Ackermann, O Margeat, B Schindler, I Wacker, J Ackermann, RR Schröder 630 A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids; YN Picard 632 Grain Size Analysis in Lithium Aluminate Ceramics; BR Johnson, N Canfield, JV Crum, B McCarthy https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxv 634 Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns; BD Myers, KA Hujsak, VP Dravid 636 In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System; J-G Zheng 638 Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope; I Müllerová, L Frank, I Konvalina, E Mikmeková 640 The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers, N Brodusch, R Gauvin, ML Trudeau, K Zaghib 642 Low Energy Secondary Electron Imaging of Nanosheets Using Inverted Fountain Detector; T Sekiguchi, T Agemura, Y Yao 644 RISE Microscopy: The Benefits of Correlative Microscopy for High Resolution Structural and Chemical Imaging of Biominerals; U Schmidt, M Eder, W Liu, D Steinmetz, G Wille 646 Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM; T Nomaguchi, S Motomura, K Nishinaka, T Agemura, T Kawasaki, R Yoshida, T Kato 648 Creating Ultrafast Electron Pulses using a Microfabricated Laser-triggered Beam Blanker; GI Weppelman, R van Tol, CC Heerkens, R Moerland, JJ Hoogenboom, P Kruit 650 New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors; M Schmid, A Liebel, G Moldovan, R Lackner, D Steigenhoefer, A Niculae, H Soltau 652 SEM Technique-based Automatic Analysis for Metal Powders and Defects in Additive Manufactured Components; Y Sun, M Aindow, R Hebert 654 Live Quantitative BSE Acquisition with Standard-less Calibration; M Hemmleb, M Schmid, U Grauel, W Joachimi, G Moldovan 656 X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM; JT Sagar, D Wood, P Pinard, JY Howe, J Holland, SR Burgess, PJ Stathem 658 Developing a Programmable STEM Detector for the Scanning Electron Microscope; BW Caplins, JD Holm, RR Keller 660 Environmental SEM as a Surface-Sensitive Tool to Study Reaction Dynamics; C Barroo, Z-J Wang, MG Willinger 662 Voltage Contrast Imaging with Energy-Controlled Signal in an FE-SEM; Y Hashimoto, S Takeuchi, T Sunaoshi, Y Yamazawa 664 The Powder-Pack Boriding and Nitriding Process: Microstructural Characterization of Boride and Nitride Layers on ARMCO Pure Iron; MO Domínguez, IS Marmolejo, ME Espinosa, MÁF Rentería, LEM Martínez, AA Flores 666 Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625; EM Getto, B Tobie, E Bautista, A Bullens, D Gandy, JP Wharry https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxix 774 New Approaches to Determine K Line Ratios of Pure Elements; R Terborg, F Reinhardt, F Nitsche, T Wolff 776 Soft Matter X-Ray Microanalysis in the Analytical Electron Microscope; M Ovsyanko, E Yucelen, E Pechnikova, M Meiken Falke, Q Chen, NJ Zaluzec 778 Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan, H Demers, R Gauvin 780 Quantitative Compositional Stage Mapping and Cluster Analysis; PK Carpenter 782 Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach; SM Seddio, PK Carpenter 784 A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis; JM Davis, J Schmidt, M Huth, R Hartmann, H Soltau, L Strüder 786 EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector; JJ McCarthy, JF Konopka 788 Quantitative Elemental Mapping of Alkali Activated Slag Cement; NA Alharbi, RK Hailstone, B Varela 790 Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78; J Twilley 792 Combined Energy Dispersive Spectrometry/Wavelength Dispersive Spectrometry Analysis of Geological Materials using an Electron Probe Microanalyzer; E Bullock 794 The Performance of Energy-dispersive X-ray Analysis at High Temperatures Using a Windowless Multidetector XEDS System; C Mitterbauer, M Ovsyanko, Y Rikers, B Freitag 796 Silicon Drift Detectors in Electron Microscopy – An Over 20-year History with a Bright Future; A Liebel, A Schöning, A Bechteler, K Hermenau, K Heinzinger, L Strüder, A Niculae, H Soltau 798 Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors; R Terborg, M Falke, T Mohr-Westheide, T Salge 800 Structural Characterization of Cu10Mo alloy Synthesized by Mechanical Alloying; O Hernández, L Béjar, A Medina, SE Borjas
Electron Microscopy:Article Title: MAM volume 24 issue s1 Cover and Front matter
Article Snippet: ; J Michael, J Carroll 612 Complementarity of On-axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM; E Brodu, E Bouzy 614 Transmission Kikuchi Diffraction of the Thermally Grown Oxide on Grain-refined NiAl-Zr; RE White, ML Weaver 616 Non-local Denoising of EBSD Patterns for Enhanced Indexing; DJ Rowenhorst, P Brewick 618 Applying SEM, EPMA and EBSD Analytic Techniques on Solder Joint for Microelectronic Package Development; T-T Chou, R-W Song, J-G Duh 620 The Joy in imaging the Auger Electron Signal in a FESEM using a Segmented Annular BSED and Stage Bias; BJ Griffin, AA Suvorova, DC Joy, JR Michael 622 Energy-Momentum Spectroscopy by Highly Parallelized Wavelength- and Angularly-Resolved Cathodoluminescence in the Scanning Electron Microscope; M Bertilson, DJ Stowe, T Worsely, T Franklin, L Muray, M Hsueh, JA Hunt 624 Joy of Scanning with Electron and X-ray Imaging; PT Pinard, S Burgess, A Hyde, J Holland, P Statham 626 DELTA – A Novel Ultra-Low Voltage SEM for Electron Spectroscopic Imaging; RR Schroeder, B Schindler, M Schnell, C Hendrich, J Wensorra, W-S Zhang, J Eisele, L Veith 628 Statistical Analysis of Secondary Electron Spectroscopic Images Using Ultra-Low Energies Reveal Nanoscale Surface Morphology of Functional Organic Blends; J Kammerer, R Alkarsifi, C Videlot-Ackermann, O Margeat, B Schindler, I Wacker, J Ackermann, RR Schröder 630 A Review of Electron Channeling Contrast Imaging for Non-Destructive Defect Analysis of Crystalline Solids; YN Picard 632 Grain Size Analysis in Lithium Aluminate Ceramics; BR Johnson, N Canfield, JV Crum, B McCarthy https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxv 634 Orientation Mapping by Electron Channeling (OMEC) and Hybrid Stage/Beam-Rocked Electron Channeling Patterns; BD Myers, KA Hujsak, VP Dravid 636 In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System; J-G Zheng 638 Role of the Angular Distribution of Backscattered Electrons in Low Energy Scanning Electron Microscope; I Müllerová, L Frank, I Konvalina, E Mikmeková 640 The Joy of Nanoscale Imaging and Spectroscopy in a Low Accelerating Voltage Scanning Transmitted Electron Microscope; H Demers, N Brodusch, R Gauvin, ML Trudeau, K Zaghib 642 Low Energy Secondary Electron Imaging of Nanosheets Using Inverted Fountain Detector; T Sekiguchi, T Agemura, Y Yao 644 RISE Microscopy: The Benefits of Correlative Microscopy for High Resolution Structural and Chemical Imaging of Biominerals; U Schmidt, M Eder, W Liu, D Steinmetz, G Wille 646 Development of Objective Aperture Holder for Mounting Compact Cs Corrector on Conventional SEM; T Nomaguchi, S Motomura, K Nishinaka, T Agemura, T Kawasaki, R Yoshida, T Kato 648 Creating Ultrafast Electron Pulses using a Microfabricated Laser-triggered Beam Blanker; GI Weppelman, R van Tol, CC Heerkens, R Moerland, JJ Hoogenboom, P Kruit 650 New Possibilities for State-of-the-Art Electron Microscopy with Fast Backscattered Electron Detectors; M Schmid, A Liebel, G Moldovan, R Lackner, D Steigenhoefer, A Niculae, H Soltau 652 SEM Technique-based Automatic Analysis for Metal Powders and Defects in Additive Manufactured Components; Y Sun, M Aindow, R Hebert 654 Live Quantitative BSE Acquisition with Standard-less Calibration; M Hemmleb, M Schmid, U Grauel, W Joachimi, G Moldovan 656 X-ray Spectrum Imaging at High Resolution in the STEM and STEM/SEM and SEM; JT Sagar, D Wood, P Pinard, JY Howe, J Holland, SR Burgess, PJ Stathem 658 Developing a Programmable STEM Detector for the Scanning Electron Microscope; BW Caplins, JD Holm, RR Keller 660 Environmental SEM as a Surface-Sensitive Tool to Study Reaction Dynamics; C Barroo, Z-J Wang, MG Willinger 662 Voltage Contrast Imaging with Energy-Controlled Signal in an FE-SEM; Y Hashimoto, S Takeuchi, T Sunaoshi, Y Yamazawa 664 The Powder-Pack Boriding and Nitriding Process: Microstructural Characterization of Boride and Nitride Layers on ARMCO Pure Iron; MO Domínguez, IS Marmolejo, ME Espinosa, MÁF Rentería, LEM Martínez, AA Flores 666 Grain Evolution in Thermally Aged Cast and Hot Isostatic Pressed Inconel 625; EM Getto, B Tobie, E Bautista, A Bullens, D Gandy, JP Wharry https://doi.org/10.1017/S1431927618012357 Downloaded from https://www.cambridge.org/core. .. IP address: 188.18.254.84, on 23 Oct 2019 at 07:34:34, subject to the Cambridge Core terms of use, available at https://www.cambridge.org/core/terms. xxix 774 New Approaches to Determine K Line Ratios of Pure Elements; R Terborg, F Reinhardt, F Nitsche, T Wolff 776 Soft Matter X-Ray Microanalysis in the Analytical Electron Microscope; M Ovsyanko, E Yucelen, E Pechnikova, M Meiken Falke, Q Chen, NJ Zaluzec 778 Secondary Fluorescence Correction of 3D Heterogeneous Materials for Quantitative X-Ray Microanalysis; Y Yuan, H Demers, R Gauvin 780 Quantitative Compositional Stage Mapping and Cluster Analysis; PK Carpenter 782 Quantitative Compositional Mapping and Multivariate Statistical Analysis: An EDS Approach; SM Seddio, PK Carpenter 784 A New Approach: Quantitative Imaging Spectrometry for Iron Oxide Analysis; JM Davis, J Schmidt, M Huth, R Hartmann, H Soltau, L Strüder 786 EDS Analysis at Low Beam Currents Facilitated by a Large Area Silicon Drift Detector; JJ McCarthy, JF Konopka 788 Quantitative Elemental Mapping of Alkali Activated Slag Cement; NA Alharbi, RK Hailstone, B Varela 790 Solid State X-ray Fluorescence Spectrometry at the J Paul Getty Museum 1977-78; J Twilley 792 Combined Energy Dispersive Spectrometry/Wavelength Dispersive Spectrometry Analysis of Geological Materials using an Electron Probe Microanalyzer; E Bullock 794 The Performance of Energy-dispersive X-ray Analysis at High Temperatures Using a Windowless Multidetector XEDS System; C Mitterbauer, M Ovsyanko, Y Rikers, B Freitag 796 Silicon Drift Detectors in Electron Microscopy – An Over 20-year History with a Bright Future; A Liebel, A Schöning, A Bechteler, K Hermenau, K Heinzinger, L Strüder, A Niculae, H Soltau 798 Quantitative Analysis of Energy-Dispersive Spectra Acquired with Large Solid Angle Detectors; R Terborg, M Falke, T Mohr-Westheide, T Salge 800 Structural Characterization of Cu10Mo alloy Synthesized by Mechanical Alloying; O Hernández, L Béjar, A Medina, SE Borjas
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